Session 4: Complete testing
Jorge López, Natalia Kushik, Asma Berriri, Nina Yevtushenko and Djamal Zeghlache
Test derivation for SDN-enabled switches: A logic circuit based approach
Aleksandr Tvardovskiia, Khaled El-Fakih and Nina Yevtushenko
Deriving Tests with Guaranteed Fault Coverage for Finite State Machines with Timeouts
Alexandre Petrenko and Florent Avellaneda
Inference and Conformance Testing of Embedded Components